The Local Chemical Analysis Of Materials

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Author: J. W. Martin
Publisher: Elsevier
ISBN: 9780080535579
Size: 21.38 MB
Format: PDF
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The Local Chemical Analysis Of Materials by J. W. Martin


Original Title: The Local Chemical Analysis Of Materials

* Expert, up-to-date guidance on the appropriate techniques of local chemical analysis * Comprehensive. This volume is an ideal starting point for material research and development, bringing together a number of techniques usually only found in isolation * Recent examples of the applications of techniques are provided in all cases Helping to solve the problems of materials scientists in academia and industry, this book offers guidance on appropriate techniques of chemical analysis of materials at the local level, down to the atomic scale. Comparisons are made between various techniques in terms of the nature of the probe employed. The detection limit and the optimum spatial resolution is also considered, as well as the range of atomic number that may be identified and the precision and methods of calibration, where appropriate. The Local Chemical Analysis of Materials is amply illustrated allowing the reader to easily see typical results. It includes a comparative table of techniques to aid selection for analysis and a table of acronyms, particularly valuable in this jargon-riddled area.

A Guide To Materials Characterization And Chemical Analysis

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Author: John P. Sibilia
Publisher: John Wiley & Sons
ISBN: 9780471186335
Size: 38.53 MB
Format: PDF, Docs
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A Guide To Materials Characterization And Chemical Analysis by John P. Sibilia


Original Title: A Guide To Materials Characterization And Chemical Analysis

This book provides an overview of the most current techniques used for chemical analysis, materials evaluation, and materials testing. Over 100 materials methodologies, evaluations, chemical analyses, physical testing, and scientific computing techniques are covered, including the fields of molecular spectroscopy, mass spectroscopy, chromatography, chemical analysis, x-ray analysis, microscopy, surface science, thermal analysis, and polymer characterization. All of the.

A Guide To Materials Characterization And Chemical Analysis

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Author: John P. Sibilia
Publisher: John Wiley & Sons
ISBN: 9780471186335
Size: 49.36 MB
Format: PDF, Mobi
View: 981

A Guide To Materials Characterization And Chemical Analysis by John P. Sibilia


Original Title: A Guide To Materials Characterization And Chemical Analysis

This book provides an overview of the most current techniques used for chemical analysis, materials evaluation, and materials testing. Over 100 materials methodologies, evaluations, chemical analyses, physical testing, and scientific computing techniques are covered, including the fields of molecular spectroscopy, mass spectroscopy, chromatography, chemical analysis, x-ray analysis, microscopy, surface science, thermal analysis, and polymer characterization. All of the.

Handbook Of Environmental Degradation Of Materials

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Author: Myer Kutz
Publisher: William Andrew
ISBN: 0815517491
Size: 51.51 MB
Format: PDF, Mobi
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Handbook Of Environmental Degradation Of Materials by Myer Kutz


Original Title: Handbook Of Environmental Degradation Of Materials

Industry pays an enormous price for material degradation. The Handbook of Environmental Degradation of Materials outlines these costs, but more importantly, explains how to measure, analyze, and prevent environmental degradation for a wide range of indsutrial materials. Experts from around the world share how a diverse set of industries cope with the degradation of metals, polymers, reinforced concrete, clothing, and wood under adverse environmental conditions such as weather, seawater, and fire. Case studies show how organizations from small consulting firms to corporate giants design and manufacture products that are more resistant to environmental effects. By implementing these standards companies of all sizes should realize savings beneficial to their operations.

Underneath The Bragg Peaks

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Author: Takeshi Egami
Publisher: Elsevier
ISBN: 0080426980
Size: 39.84 MB
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Underneath The Bragg Peaks by Takeshi Egami


Original Title: Underneath The Bragg Peaks

This book describes a technique of structural study, the atomic-pair distribution function analysis. This is a relatively new technique, with a strong promise of wide application in the study of the local structure of crystalline materials and materials science in general.

Reliability And Failure Of Electronic Materials And Devices

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Author: Milton Ohring
Publisher: Elsevier
ISBN: 9780080516073
Size: 45.38 MB
Format: PDF, Mobi
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Reliability And Failure Of Electronic Materials And Devices by Milton Ohring


Original Title: Reliability And Failure Of Electronic Materials And Devices

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed. The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. Discusses reliability and failure on both the chip and packaging levels Handles the role of defects in yield and reliability Includes a tutorial chapter on the mathematics of reliability Focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the mechanical failure of packages, contacts, and solder joints Considers defect detection methods and failure analysis techniques

Handbook Of Materials Failure Analysis With Case Studies From The Aerospace And Automotive Industries

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Author: Abdel Salam Hamdy Makhlouf
Publisher: Butterworth-Heinemann
ISBN: 0128011777
Size: 76.70 MB
Format: PDF, Mobi
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Handbook Of Materials Failure Analysis With Case Studies From The Aerospace And Automotive Industries by Abdel Salam Hamdy Makhlouf


Original Title: Handbook Of Materials Failure Analysis With Case Studies From The Aerospace And Automotive Industries

Handbook of Materials Failure Analysis: With Case Studies from the Aerospace and Automotive Industries provides a thorough understanding of the reasons materials fail in certain situations, covering important scenarios, including material defects, mechanical failure as a result of improper design, corrosion, surface fracture, and other environmental causes. The book begins with a general overview of materials failure analysis and its importance, and then logically proceeds from a discussion of the failure analysis process, types of failure analysis, and specific tools and techniques, to chapters on analysis of materials failure from various causes. Later chapters feature a selection of newer examples of failure analysis cases in such strategic industrial sectors as aerospace, oil & gas, and chemicals. Covers the most common types of materials failure, analysis, and possible solutions Provides the most up-to-date and balanced coverage of failure analysis, combining foundational knowledge, current research on the latest developments, and innovations in the field Ideal accompaniment for those interested in materials forensic investigation, failure of materials, static failure analysis, dynamic failure analysis, fatigue life prediction, rotorcraft, failure prediction, fatigue crack propagation, bevel pinion failure, gasketless flange, thermal barrier coatings Presents compelling new case studies from key industries to demonstrate concepts Highlights the role of site conditions, operating conditions at the time of failure, history of equipment and its operation, corrosion product sampling, metallurgical and electrochemical factors, and morphology of failure

Physico Chemical Analysis Of Industrial Catalysts

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Author: John Lynch
Publisher: Editions TECHNIP
ISBN: 9782710808374
Size: 65.31 MB
Format: PDF, ePub, Docs
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Physico Chemical Analysis Of Industrial Catalysts by John Lynch


Original Title: Physico Chemical Analysis Of Industrial Catalysts

This book describes the principal physico-chemical techniques for characterising the catalysts used in searching for new active phases, optimising the formulation and monitoring industrial production. Based on courses given at the Institut Francias du Peole for research technicians in the fields of kinetics and catalysis, this book covers useful basic theory and provides numerous examples of industrial applications. This guide is an essential companion for technicians and chemical engineers whose work requires an understanding of the fields of application, including the capabilities and the limits of today's complex characterisation techniques.Contents: Introduction. 1. Textural characterisation of catalysts. 2. Atomic absorption spectrometry. 3. Atomic emission spectroscopy. 4. X-ray fluorescence. 5. X-ray photoelectron spectroscopy. 6. Ion impact analysis. 7. Scanning electron microscopy. 8. Elemental analysis in the electron microprobe. 9. Transmission electron microscopy. 10. X-ray diffraction and small-angle scattering. 11. Exafs. 12. Infrared absorption spectrometry. 13. Nuclear magnetic resonance. 14. Thermal analysis methods. Index

Microscopy Of Semiconducting Materials 2007

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Author: A.G. Cullis
Publisher: Springer Science & Business Media
ISBN: 9781402086151
Size: 24.83 MB
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Microscopy Of Semiconducting Materials 2007 by A.G. Cullis


Original Title: Microscopy Of Semiconducting Materials 2007

This volume contains invited and contributed papers presented at the conference on ‘Microscopy of Semiconducting Materials’ held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.

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