Vlsi Test Principles And Architectures

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Author: Laung-Terng Wang
Publisher: Elsevier
ISBN: 9780080474793
Size: 42.11 MB
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Vlsi Test Principles And Architectures by Laung-Terng Wang


Original Title: Vlsi Test Principles And Architectures

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

System On Chip Test Architectures

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Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 9780080556802
Size: 73.25 MB
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System On Chip Test Architectures by Laung-Terng Wang


Original Title: System On Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Electronic Design Automation

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Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 9780080922003
Size: 62.59 MB
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Electronic Design Automation by Laung-Terng Wang


Original Title: Electronic Design Automation

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes

Lean Architecture

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Author: James O. Coplien
Publisher: John Wiley & Sons
ISBN: 0470970138
Size: 24.56 MB
Format: PDF, Docs
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Lean Architecture by James O. Coplien


Original Title: Lean Architecture

More and more Agile projects are seeking architectural roots as they struggle with complexity and scale - and they're seeking lightweight ways to do it Still seeking? In this book the authors help you to find your own path Taking cues from Lean development, they can help steer your project toward practices with longstanding track records Up-front architecture? Sure. You can deliver an architecture as code that compiles and that concretely guides development without bogging it down in a mass of documents and guesses about the implementation Documentation? Even a whiteboard diagram, or a CRC card, is documentation: the goal isn't to avoid documentation, but to document just the right things in just the right amount Process? This all works within the frameworks of Scrum, XP, and other Agile approaches

Testing Of Digital Systems

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Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9781139437431
Size: 27.93 MB
Format: PDF
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Testing Of Digital Systems by N. K. Jha


Original Title: Testing Of Digital Systems

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Vlsi Testing

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Author: Stanley Leonard Hurst
Publisher: IET
ISBN: 9780852969014
Size: 26.38 MB
Format: PDF, Kindle
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Vlsi Testing by Stanley Leonard Hurst


Original Title: Vlsi Testing

This book is a self-contained introduction to all aspects of microelectronic (IC) testing. It includes the theory necessary for advanced students as well as reference to industrial practice and economics that will interest designers in industry. Chapters cover both digital circuit testing and the growing area of mixed circuits, used particularly in signal processing.

Principles Of Testing Electronic Systems

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Author: Samiha Mourad
Publisher: John Wiley & Sons
ISBN: 9780471319313
Size: 32.84 MB
Format: PDF, ePub, Mobi
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Principles Of Testing Electronic Systems by Samiha Mourad


Original Title: Principles Of Testing Electronic Systems

A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever–increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way–learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much–needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today′s very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: ∗ An explanation of where a test belongs in the design flow ∗ Detailed discussion of scan–path and ordering of scan–chains ∗ BIST solutions for embedded logic and memory blocks ∗ Test methodologies for FPGAs ∗ A chapter on testing system on a chip ∗ Numerous references

Handshake Circuits

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Author: Kees van Berkel
Publisher: Cambridge University Press
ISBN: 0521452546
Size: 18.31 MB
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Handshake Circuits by Kees van Berkel


Original Title: Handshake Circuits

This volume describes a programming approach to the design of digital VLSI circuits. Programs written in the VLSI-programming language Tangram can be compiled automatically in full asynchronous (delay-insensitive) circuits. Handshake circuits serve as an intermediary in this translation, separating programming concerns from concerns of efficient VLSI-circuit implementation. Handshake circuits have been invented by Kees van Berkel, and were further developed at Philips Research Laboratories. The book presents a mathematical theory of handshake circuits and a silicon compiler supported by a correctness proof. The treatment of VLSI realizations of handshake circuits includes various forms of optimization, handshake refinement, message encoding, circuit initialization, and testing. The approach is illustrated by a host of examples drawn from a wide range of application areas, including FIFO queues, shift registers, FIR filters, median filters, block sorters, a greatest common divisor, modulo-N counters, stacks, a nacking arbiter, and a simple processor. The treatment of these examples emphasizes concerns for circuit cost, performance, and power consumption. The book includes an evaluation of a compiled and fabricated IC.

The Vlsi Handbook Second Edition

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Author: Wai-Kai Chen
Publisher: CRC Press
ISBN: 1420005960
Size: 36.14 MB
Format: PDF, ePub, Docs
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The Vlsi Handbook Second Edition by Wai-Kai Chen


Original Title: The Vlsi Handbook Second Edition

For the new millenium, Wai-Kai Chen introduced a monumental reference for the design, analysis, and prediction of VLSI circuits: The VLSI Handbook. Still a valuable tool for dealing with the most dynamic field in engineering, this second edition includes 13 sections comprising nearly 100 chapters focused on the key concepts, models, and equations. Written by a stellar international panel of expert contributors, this handbook is a reliable, comprehensive resource for real answers to practical problems. It emphasizes fundamental theory underlying professional applications and also reflects key areas of industrial and research focus. WHAT'S IN THE SECOND EDITION? Sections on... Low-power electronics and design VLSI signal processing Chapters on... CMOS fabrication Content-addressable memory Compound semiconductor RF circuits High-speed circuit design principles SiGe HBT technology Bipolar junction transistor amplifiers Performance modeling and analysis using SystemC Design languages, expanded from two chapters to twelve Testing of digital systems Structured for convenient navigation and loaded with practical solutions, The VLSI Handbook, Second Edition remains the first choice for answers to the problems and challenges faced daily in engineering practice.

Vlsi Design

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Author: V.S. Bagad
Publisher: Technical Publications
ISBN: 9788184314441
Size: 24.55 MB
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Vlsi Design by V.S. Bagad


Original Title: Vlsi Design

VHDL Modeling and Design Flow VLSI : Complete VLSI design flow (with reference to an EDA tool), Sequential, Data flow and structural modeling, Functions, Procedures, Attributes, Test benches, Synthesizable and non-synthesizable statements; Packages and configurations modeling in VHDL with examples of circuits such as counters, Shift registers, Bidirectional bus, etc. FSM and Sequential Logic Principles Sequential circuits, Meta-stability synchronization, Design of finite state machines and state minimization, FSM CASE STUDIES - Traffic light control, Lift control and UART, STA and DTA. Programmable Logic Devices The CPLDs, Study of architecture of CPLD and study of the architecture of FPGA.System On Chip One, Two phase clock, Clock distribution, Power distribution, Power optimization, SRC and DRC, Design validation, Global routing, Switch box routing, Off chip connections, I/O architectures, Wire parasitics, EMI immune design, Study of memory-Basics of memory includes types of memory cells and memory architectures, Types of memory based on architecture specific and application specific viz. SRAM, DRAM, SDRAM, FLASH, FIFO. CMOS VLSI CMOS parasitics, Equivalent circuit, Body effect, Technology scaling, parameter, Detail study of inverter characteristics, Power dissipation, Power delay product, CMOS combinational logic design and W/L calculations, Transmission gates, Introduction to CMOS layout. Testability Need of design for testability, Introduction to fault coverage, Testability, Design-for-Testability, Controllability and Observability, Stuck-at Fault Model, Stuck-Open and Stuck-Short faults, Boundary scan check, JTAG technology, TAP controller and TAP controller state diagram, Scan path, Full and Partial scan, BIST.

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